The beamline has three probes optimised for studies at length-scales spanning 3 orders of magnitude.  A milliprobe has a resolution of around 50 µm; a Kirkpatrick-Baez (KB) mirror microprobe is optimised for applications requiring high flux at the micron length scale, and; a zone-plate (ZP) nanoprobe can be used to obtain extremely high-resolution maps at the 100-nm length scale. These systems can be used to obtain maps of elemental distribution and for a range of spectroscopic applications such as determining oxidation state and speciation.

Please check the  Beamline updates page for the most up to date information about XFM.

Beamline Properties

Source

In-Vacuum Undulator
n = 90 periods, 22 mm length

Monochromation Si DCM, <1,1,1> OR <3,1,1> reflection
Energy Range 4.1 - 20 keV
Energy Resolution ΔE/E ~ 10-4

 

Typical probe performance (10 keV)
Focusing method milliprobe microprobe nanoprobe
Resolution[µm] 50 - 200 1 - 5 0.15 - 0.6
Scan range [mm * mm] 600 * 1200 100 * 100 10 * 10
Flux @ coarsest resolution [ph/s] 1012 4 . 1011 1010
Flux density [ph/s/µm2] 106 1010 1012

 

Detector characteristics
Type Vortex EM-90 Maia Rev C
Geometry 90-degree

180-degree
(Backscatter)

Minimum Energy 1.6 keV 2.0 keV
Solid Angle 0.1 sr 1.1 sr
Peak count rate 500 kHz 1.4 MHz
Energy Resolution [eV] 120 220