Instrument control
The microscope and spectrometer are controlled through Bruker Opus software version 6.5. This controls data acquisition, sample stage position and automated data collection, including multipoint grid mapping.

Energy range
The IR microscope is currently optimised for wavenumber range of 3800-700 cm^-1. The high wavenumber range can be extended to 6000 cm^-1 if required.

Detectors
Two detectors are currently available for use with the microscope. Most measurements are conducted with a narrow-band, high sensitivity liquid nitrogen cooled Mercury Cadmium Telluride (MCT) detector. A wide-band MCT detector extends the detection range beyond that of the narrow-band, but with a significant loss of sensitivity.
Narrow Band (100 µm detector element) – low wavenumber limit – 700 cm^-1
Wide Band (250 µm detector element) – low wavenumber limit of 450 cm^-1

Beamline performance and calibration
Calibration is undertaken by the beamline staff in advance of users’ experiments, or following a change of beamline configuration during an experiment (e.g. from reflectance to ATR).

Beam intensity and noise
Beam intensity of a defined focus size on the sample and the observed baseline noise are recorded in each instance. Typical noise values measured in reflectance, with details of the measurement conditions, are given below. The noise is assessed in two 100 cm^-1 regions of a %T spectrum calculated from two sequential “single beam” spectra collected under identical conditions.

Spatial Resolution
Spatial resolution can be assessed using a custom test target consisting of polymeric patterns deposited on either an infrared reflecting or transmitting substrate. An example image recorded in transmission is shown below. This clearly demonstrates spatial resolution of 3 microns which illustrated by the sharp edge profile of the IR absorbance between the two red arrows at 2935 cm^-1 in the image below.